The Intermediate Silicon Layers (ISL) will provide precision space point measurements at radii intermediate between SVXII and COT. Combining these measurements with SVXII allows precision standalone tracking with up to 7 axial and 7 stereo measurements. The resulting tracks have pT resolution of about 0.4%/pT2 and impact parameter resolution of about 20 microns. This is sufficient for b-tagging and lepton identification even without the addition of COT information, and extends these capabilities into the plug region (1 < |eta| < 2). Original concept and performance measures are described in detail in chapter 6 of the CDF II TDR.
| CDF Internal | ISL Italy | ISL Japan | ISL Germany | ISL UCLA | ISL UCD |
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