The three main components of the silicon tracker each use different silicon
sensor designs and layouts. Because it will be mounted closest to the beam,
Layer 00 will consist of single-sided AC coupled p-in-n silicon with a guard
structure designed to minimize leakage currents. This
configuration is intended to improve radiation
resistance[10]. Two widths of sensors (8.4 mm and 14.6 mm)
will be interleaved in a 12-sided pattern that is physically mounted on and
supported by the beam pipe. Each sensor will have a mechanical length
of 78.4 mm and will be bonded to one other sensor to form pairs that are
electrically 15.7 cm in active length. These sensors have an
implant pitch of 25
m, implant widths of
8
m, and a readout pitch of 50
m achieved by
reading out alternate strips. Fine-pitch kapton cables carry
signals from each of the six pairs of Layer 00 sensors to hybrids mounted at
the ends of the array.
The next five layers of the tracker, which comprise the SVX II portion of the design, consist of wire-bonded pairs of double-sided detectors with readout electronics in the form of hybrids that are mounted directly to the silicon surface at each end of each four-sensor mechanical ladder assembly. The length of each ladder is 29 cm, with each consisting electrically of two half-ladders that are read out independently. A perspective view of one end of one of these assemblies is shown in Figure 7.
Both 90-degree and small-angle stereo sensors are used in the
SVX II, in the pattern
degrees for the n-strips
from the innermost to outermost SVX II layers. All SVX II sensors are AC
coupled, 300
m thick, and biased using polysilicon resistors. The p-strips
on the non-stereo side run in the axial direction of the detector and are used
to measure the azimuthal angle
in the experiment. These strips are
spaced in
by approximately 60 to 65 microns, depending on layer, and
have implant widths of 14 to 15 microns.
The stereo n-strips of the SVX II are spaced by
microns, and have implant widths of 20 microns for the
strips and 15 microns for the small-angle stereo layers. The
layers have an additional layer of insulator and readout strips in the
``double-metal'' configuration[15]; these strips carry the
signals to the SVX3 chips with a pitch that ranges from 58 to 60 microns
depending on layer. The
-stereo sensors are manufactured by
Hamamatsu Photonics. The small-angle stereo SVX II sensors are manufactured
by Micron Semiconductor.
Common p-stops with widths of 21
m along with individual p-stops of width
15
m are used in the
-stereo layers. In the small-angle
stereo SVX II layers, individual p-stops are not used, and the common p-stops
have widths of 28 to 30 microns.
Type inversion at high radiation doses might render
these p-stops ineffective, but the n+ implants will remain isolated.
Other radiation-induced effects will in practice limit the operating life of
the sensors, such as the increased voltage necessary to achieve depletion,
the resulting increases in current and dissipated power, and degradation of
interstrip resistance with radiation[14].
Present estimates
indicate that the innermost SVX II sensors will degrade beyond usable
levels after the first 2 to 3 years of operation, corresponding to several
n/cm
[14]. Layer 00, which is single-sided
and thus can operate acceptably even when not fully depleted, should be able
to withstand the higher radiation doses that it will encounter at its small
inner radius. Along with the remaining layers of the SVX II and ISL, this
should preserve functional
tracking and at least some stereo capability to as much as 5 fb
of accumulated Tevatron data[10].
The ISL portion of the tracker utilizes larger-pitch double sided sensors
made in both 4" (Hamamatsu) and 6" (Micron) technology[16].
These sensors are also AC coupled, with polysilicon biasing and common p
stops. A fixed strip pitch of 112
m is used on both the axial and
1.2-degree stereo sides. Pitch adapters are used to
bring the signals from the strips to the more closely spaced inputs of the
SVX3D chips. The stereo strips are on the n side
for the Micron sensors and on the p side for the Hamamatsu sensors.
The ISL ladders are composed of six sensors,
arranged as half-ladders of three sensors each. This arrangement is shown in
Figure 8. Because of the larger strip pitch, positioning
tolerances for placement of these ladders are easier to achieve in the ISL.
Taking advantage of the
increased amount of space compared to the SVX II, these ladders overlap each
other in
and are read out at each ladder end with double-sided hybrids that
extend beyond the silicon. The innovative design of the carbon-fiber
ladder support allows wirebonding to be done after the ladder has been
assembled. This arrangement simplifies ladder construction and permits
microbonds to be repaired even after assembly.