Aging of the Jumper connection

For suggestions and questions send e-mail to: Gino Bolla or MAurice Garcia Sciveres

This theory implies an aging mechanism on the vias of the jumper. Maurice, Azizur and Joel are setting up a certain number (10-15) of left over jumpers and they are going to connect the power VIAs to each other on a serial line so that with a single Power Supply multiple connections will be tested. Azizur made some calculation and 5 Years at operating conditions at CDF are translated to 1 week at 90 deg C. So we are going to get the device with 60-100 connection powered up in an Oven at SiDet.

Here is the schematic of the board that will be used for this test as sent by Maurice:

Here is the documentation collected so far:

• write-up of tests and conclusions from Azizur. in postscript format
• e-mail exchanged between Maurice and the FNAL guys. in pdf format
• status as of 10-21-2002. in pdf format