Results are presented from the probing of Svx2b wafer number 2 (out of 3 
wafers made). The yield of die with no defects found by a limited set of 
tests is 51\%. However, only 10\% of the die are electrically unusable, and 
the yield of usable die can be larger than 51\%, depending on the application. 
 
Posted to CDF$PUB:CDF3405_SVX2_WAFER_PROBE.PS
Posted by FNALH::MGS