Table of Contents
SVX IISilicon Vertex Detector
Outline
Institutions
Work Breakdown Structure
Cross Sectional View of Barrel End
SVX II Parameters
Ladder
Silicon Sensors
Silicon Sensors Specifications
Sensor: Radiation Damage Studies
Test Beam
Production Sensor Probing
Sensor Production: Hamamatsu
Sensor Production: Micron
Sensor Production: Micron(cont’d)
Sensor Production: Micron(cont’d)
Sensor Progress
SVX3 Chip
SVX3 Schedule
SVX3 Chip Progress
SVX3 Chip Progress (cont’d.)
SVX3 Chip
SVX3 Specifications
SVX3 Performance
SVX3 Noise Performance
SVX3 Radiation Tests
SVX3 Radiation Tests (cont’d)
Hybrid Progress
Hybrid Technology Comparison
Ladder Progress
Bulkhead Progress
Bulkhead Progress (cont’d)
Bulkhead Progress (cont’d)
Bulkead Flow/Cooling Testing
Barrel Fabrication
DAQ glossary
DAQ(a) for SVX II
DAQ (a) for ISL
DAQ (b)
Prototype DAQ
Prototype DAQ System at Test Beam
DOIM Progress
DOIM Progress (cont’d)
Portcard Progress
Power Supplies
DAQ Status
DAQ Software
Cost Performance
Use of Contingency
Cost Estimate to Complete
Labor Estimate
Milestones
Schedule: Critical Path
Assembly Plan
Summary
Estimate to Complete
Micron Production
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