- We apply acceptance values to tagged rates (W+D*)tagged/Wtagged and unfold to measurements of σ(W/Z+D*)/σ(W/Z), both for the inclusive sample (D* transverse momentum > 3 GeV), and differentially as a function of the D* transverse momentum. Results from the electron and muon decay channels are combined with a best linear uncertainty estimate, assuming that systematic uncertainties are fully correlated.
- We present here the inclusive measurements:
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- And differential measurements as a function of the D* transverse momentum:
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- As well as plots of the differential measurements as a function of the D* transverse momentum. Statistical uncertainty in these plots is shown with error bars, while statistical plus systematic uncertainty is displayed as a yellow error band. Uncertainty in the theoretical predictions is displayed as red lines on either side of the dotted red line representing the central theoretical value.
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